Předmět Spectroscopic and Microscopic Methods for Characterisation of Materials (S107020)
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Další informace
Sylabus
1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping. X-ray fluorescence spectroscopy.8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction, powder diffraction.13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole mass analyser, time-of-flight analyser, other detectors and analysers.
Literatura
Z: Y. Leng, Materials characterization, Wiley, 2008.Z: R.F. Egerton, Physical principles of electron microscopy, 2005.
Garant
Gedeon Ondrej prof. RNDr. Ph.D.