tlc272

CL = 20 pF,
See Figure 1

– 55

°C

280

kHz

BOM

Maximum out ut swing bandwidth

RL = 10 kΩ,

See Figure 1

125

°C

110

V

10

V

C

20 F

25

°C

2.2

B1

Unity-gain bandwidth

VI = 10 mV,
See Figure 3

CL = 20 pF,

– 55

°C

3.4

MHz

B1

Unity gain bandwidth

See Figure 3

125

°C

1.6

V

10

V

f

B

25

°C

49

°

φm

Phase margin

VI = 10 mV,
CL = 20 pF

f = B1,
See Figure 3

– 55

°C

52

°

φm

g

CL = 20 pF,

See Figure 3

125

°C

44

°

TLC272, TLC272A, TLC272B, TLC272Y, TLC277

LinCMOS

 PRECISION DUAL OPERATIONAL AMPLIFIERS

SLOS091E – OCTOBER 1987 – REVISED FEBRUARY 2002

15

POST OFFICE BOX 655303 

• DALLAS, TEXAS 75265

operating characteristics, VDD = 5 V, TA = 25°C

PARAMETER

TEST CONDITIONS

TLC272Y

UNIT

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

SR

Slew rate at unity gain

RL = 10 kΩ,

CL = 20 pF,

VIPP = 1 V

3.6

V/ s

SR

Slew rate at unity gain

RL = 10 kΩ,
See Figure 1

CL = 20  F,

VIPP = 2.5 V

2.9

V/

µ

Vn

Equivalent input noise voltage

f = 1 kHz,

RS = 20 Ω,

See Figure 2

25

nV/

√Hz

BOM

Maximum output-swing bandwidth

VO = VOH,
See Figure 1

CL = 20 pF,

RL = 10 kΩ,

320

kHz

B1

Unity-gain bandwidth

VI = 10 mV,

CL = 20 pF,

See Figure 3

1.7

MHz

φm

Phase margin

VI = 10 mV,
See Figure 3

f = B1,

CL = 20 pF,

46

°

operating characteristics, VDD = 10 V, TA = 25°C

PARAMETER

TEST CONDITIONS

TLC272Y

UNIT

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

SR

Slew rate at unity gain

RL = 10 kΩ,

CL = 20 pF,

VIPP = 1 V

5.3

V/ s

SR

Slew rate at unity gain

RL = 10 kΩ,
See Figure 1

CL = 20  F,

VIPP = 5.5 V

4.6

V/

µ

Vn

Equivalent input noise voltage

f = 1 kHz,

RS = 20 Ω,

See Figure 2

25

nV/

√Hz

BOM

Maximum output-swing bandwidth

VO = VOH,
See Figure 1

CL = 20 pF,

RL = 10 kΩ,

200

kHz

B1

Unity-gain bandwidth

VI = 10 mV,

CL = 20 pF,

See Figure 3

2.2

MHz

φm

Phase margin

VI = 10 mV,
See Figure 3

f = B1,

CL = 20 pF,

49

°

TLC272, TLC272A, TLC272B, TLC272Y, TLC277
LinCMOS

 PRECISION DUAL OPERATIONAL AMPLIFIERS

SLOS091E – OCTOBER 1987 – REVISED FEBRUARY 2002

16

POST OFFICE BOX 655303 

• DALLAS, TEXAS 75265

PARAMETER MEASUREMENT INFORMATION

single-supply versus split-supply test circuits

Because the TLC272 and TLC277 are optimized for single-supply operation, circuit configurations used for the
various tests often present some inconvenience since the input signal, in many cases, must be offset from
ground. This inconvenience can be avoided by testing the device with split supplies and the output load tied to
the negative rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either
circuit gives the same result.